Chapter 1. Introduction T1 ESF CSU ACE User Manual
24 © 2004 ADTRAN, Inc 61204025L1-1B
T1 ESF CSU ACE TESTING
The T1 ESF CSU ACE offers three forms of testing:
•Self test
• Loopback tests
• Pattern generation
Self Test
The self test checks the integrity of the electronic components’ internal operation by performing memory
tests and sending and verifying data test patterns through all internal interfaces. Although actual user data
cannot be passed during these tests, the self test can be run with the network and DTE interfaces in place
and will not disturb any external interface.
The self test automatically executes upon power-up. It can also be initiated from a front panel menu or
from the control port.
In addition to the specified self tests, background tests are run on various parts of the internal electronics.
These run during normal operation to confirm continued correct functioning. The background tests include
the standard background network performance monitoring as required by ANSI T1.403 and AT&T 54016,
for which the results are stored.
